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Yesterday ScienceDesk took the opportunity for an online presentation at the 15th Silicon Saxony Day. Together with Dr. Jan Neumann from NenoVision (Brno, Czech Republic), Dr. Carlos Viol Barbosa presented “Material characterization using correlative microscopy and artificial intelligence”.

Correlative materials characterization requires to manage unorganized data with complex format from several analytical techniques, particularly image data from microscopy techniques. Scanning electron microscopy and atomic force microscopy are two complementary techniques that provide structural and surface information on the nanoscale. Integrating a compact AFM into a SEM is an approach with completely new possibilities for fundamental research as well as for chemical and semiconductor industry. Fully automated correlative imaging analysis using AI algorithms, allowing a precise and accurate analysis of multimodal data, were presented. The solution is a joined development of NenoVision (Brno, Czech Republic) and ScienceDesk (Freital, Germany).

The event was rounded off by our short pitch “Ready to use and secure AI supply”.

For more information on immediate AI use, we are happy to assist interested device manufacturers.